In this present work, pure alpha-MnO2 nanorods were fabricated by the reduction of 0.2 m/L of KMnO4 with 0.2 m/L, of Na2S2O3 center dot 5H(2)O and by passivating with the organic ligand Ethylenediamine (EDA). The structural, functional, morphological and chemical composition of the nanorods were investigated by X-Ray Diffractometer (XRD), Fourier Transform Infrared Spectrometer (FTIR), High Resolution Scanning Electron Microscope (HR-SEM) and Energy Dispersive X-Ray Spectrometry (EDX). The XRD analysis indicated high crystalline nature of the product and FTIR confirmed the contribution of the organic ligand in surface passivation. HR-SEM image revealed the morphology of the alpha-MnO2 nanorods with an average size of about 40 x 200 nm. EDX confirmed the presence of Mn and O in the material. UV-visible spectrophotometery was used to determine the absorption behavior of the nanorods and an indirect band gap of 1.37 eV was acquired by Taucplot. Dielectric studies were carried out using Broadband Dielectric Spectrometer(BDS) and the resistivity was found to be around the semiconductor range (rho = 1.46 to 5.76 x 10(3) Omega cm). (C) 2016 Elsevier Ltd. All rights reserved.