Cu2ZnxCd1-xSnS4 (CZCTS) thin films were deposited on soda-lime glass (SLG) substrates by rf magnetron sputtering. It is found that the Cd/Zn atomic ratio of kesterite CZCTS increases with the enhancement of sputtering power. The structural, surface morphology and optical properties of the CZCTS thin films deposited at different sputtering power were systemically investigated. The X-ray diffraction (XRD) measurements indicate that all CZCTS thin films are polycrystalline with kesterite structure and no impurity phase is observed. The variation of Cd/Zn atomic ratio in CZCTS results in the shift of the optical bandgap. (C) 2016 Elsevier B.V. All rights reserved.