Scanning nanofocus X-ray diffraction (nXRD) performed at a synchrotron is used to simultaneously probe the morphology and the structural properties of spin-coated CH3NH3PbI3 (MAPI) perovskite films for photovoltaic devices. MAPI films are spin-coated on a Si/SiO2/poly(3,4-ethylenedioxythiophene): polystyrene sulfonate (PEDOT:PSS) substrate held at different temperatures during the deposition in order to tune the perovskite film coverage. The films are then investigated using nXRD and scanning electron microscopy (SEM). The advantages of nXRD over SEM and other techniques are discussed. A method to visualize, selectively isolate, and structurally characterize single perovskite grains buried within a complex, polycrystalline film is developed. The results of nXRD measurements are correlated with solar cell device measurements, and it is shown that spin-coating the perovskite precursor solution at elevated temperatures leads to improved surface coverage and enhanced solar cell performance.