A new technique and an apparatus which provide a promising approach for simultaneous spatial and temporal resolution of optically initiated dynamics at interfaces are presented. The method, based on the integration of femtosecond optical spectroscopy and scanning probe microscopy (FOS-SPM), is shown to be capable of spatially localizing optical measurements at an interface via. coupling of the optical field to a metal SPM tip. FOS-SPM measurements are shown to obtain femtosecond time resolution in optically induced processes via an optical pump-probe correlation method. The ability of FOS-SPM to identify and differentiate between different optoelectronic mechanisms is demonstrated. The potentially broad applicability of the technique for the study of interfacial and adsorbate dynamics of numerous systems with simultaneous high spatial and temporal resolution is discussed.