Fully hydrogenated and partially deuterated free standing films of polyaniline doped with (+/-) camphorsulfonic acid (PANIh5/CSA and PANId4/CSA) are subjected to neutron diffraction study. Obtained results are analyzed and compared with X-ray diffraction measurements. The very distinct differences observed between the two neutron diffraction profiles are described in detail. Making use of the recently published new model of the crystalline structure of the PANI/CSA system, the neutron diffraction curves for the analogous structures are calculated. The two calculated neutron diffraction patterns exhibit similar differences as those obtained in experiment. This fully confirms the validity of the refined molecular model elaborated for this still important material for applications as synthetic metals or organic thermoelectrics. (C)2017 Elsevier Ltd. All rights reserved.