Applied Surface Science, Vol.423, 25-32, 2017
Investigating pitting in X65 carbon steel using potentiostatic polarisation
Although pitting corrosion in passive materials is generally well understood, the growth of surface pits in actively-corroding materials has received much less attention to date and remains poorly understood. One of the key challenges which exists is repeatedly and reliably generating surface pits in a practical time-frame in the absence of deformation and/or residual stress so that studies on pit propagation and healing can be performed. Another pertinent issue is how to evaluate pitting while addressing general corrosion in low carbon steel. In this work, potentiostatic polarisation was employed to induce corrosion pits (free from deformation or residual stress) on actively corroding X65 carbon steel. The influence of applied potential (50 mV, 100 mV and 150 mV vs open circuit potential) was investigated over 24 h in a CO2-saturated, 3.5 wt.% NaC1 solution at 30 degrees C and pH 3.8. Scanning electron microscopy (SEM) was utilised to examine pits, while surface profilometry was conducted to measure pit depth as a function of applied potential over the range considered. Analyses of light pitting (up to 120 mu m) revealed that pit depth increased linearly with increase in applied potential. This paper relates total pit volume (measured using white light interferometry) to dissipated charge or total mass loss (using the current response for potentiostatic polarisation in conjunction with Faraday's law). By controlling the potential of the surface (anodic) the extent of pitting and general corrosion could be controlled. This allowed pits to be evaluated for their ability to continue to propagate after the potentiostatic technique was employed. Linear growth from a depth of 70 mu m at pH 3.8, 80 degrees C was demonstrated. The technique offers promise for the study of inhibition of pitting. (C) 2017 Elsevier B.V. All rights reserved.
Keywords:X65 carbon steel;CO2 corrosion;Pitting;Potentiostatic polarisation and white light;profilometry