A set of Zn1-xCdxO thin films with different Cd concentrations was deposited on quartz substrates by Pulsed Laser Deposition (PLD). The properties of these films were investigated by variable angle and temperature dependent spectroscopic ellipsometry (SE). The experimental Zn1-xCdxO thin films showed a red shift in the absorption edge with increasing Cd contents at room temperature. For ZnCdO films with the similar Cd concentration, it has been found that the film thickness has important effects on the optical constants (n, k). The variations of optical constants (n, k) and the band gap, E-0, with temperature (T) in 25 degrees C-600 degrees C for a typical Zn0.95Cd0.05O sample were obtained. The E-0 vs T relationship is described by a T-quadratic equation. (C) 2017 Elsevier B.V. All rights reserved.