Journal of the American Ceramic Society, Vol.100, No.12, 5379-5384, 2017
Cation grain-boundary diffusivity in SiO2- and MgO-doped Al2O3
Cation grain-boundary diffusion in undoped and aliovalent-doped Al2O3 is characterized using Cr2O3 as a chemical tracer. The compositional depth profiles measured by secondary ion mass spectrometry are fitted to the Whipple-LeClaire model. The results indicate that cation grain-boundary diffusivity is insensitive to MgO and SiO2 dopants between 1100 degrees C and 1300 degrees C.