Analysis of codeposited Gd2O3/SiO2 composite thin films by phase modulated spectroscopic ellipsometric technique (Retraction of Vol 253, Pg 1787, 2006)

Sahoo NK; Thakur S; Tokas RB

Applied Surface Science, Vol.427, 1280-1280, 2018

DOI10.1016/j.apsusc.2017.10.062 Export Citation

Analysis of codeposited Gd2O3/SiO2 composite thin films by phase modulated spectroscopic ellipsometric technique (Retraction of Vol 253, Pg 1787, 2006)

Sahoo NK, Thakur S, Tokas RB