Lattice strain is a relatively unexplored route to modify the degradation effects in functional oxides for high-temperature electrochemical devices. In this paper, we present results on the segregation of Gd to the surface of strained Gd0.1Ce0.9O2- films using low-energy ion scattering to assess the surface composition. The potential for strain-modified segregation is discussed as well as the challenges in studying and implementing it.