Predicting the fast transition conditions by the correlation of particle entrainment rate

Yoo Sube Won; Daewook Kim; Jeong-Hoo Choi

Korean Journal of Chemical Engineering, Vol.35, No.3, 812-817, March, 2018

DOI10.1007/s11814-017-0319-3 Export Citation

Predicting the fast transition conditions by the correlation of particle entrainment rate

Yoo Sube Won, Daewook Kim, and Jeong-Hoo Choi^†

Department of Chemical Engineering, Konkuk University, 120 Neungdong-ro, Gwangjin-gu, Seoul 05029, Korea

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A model for predicting the fast transition condition in a riser of a circulating fluidized bed was proposed using the correlation of particle entrainment rate. The saturation carrying capacity of Bai and Kato could be regarded as the particle entrainment rate at the fast transition condition. The correlation of Choi et al. on particle entrainment rate could be used as a tool to predict the fast transition condition. The effect of interparticle forces seemed to be negligible at the fast transition condition. The model was in fair agreement with the measured values at the fast transition condition.

Keywords:Saturation Carrying Capacity;Fast Transition Velocity;Fast Fluidization;Riser;Circulating Fluidized Bed

[References]

Bai DL, Kato K, J. Chem. Eng. Jpn., 28(2), 179 (1995)
Namkung W, Kim SW, Kim SD, Chem. Eng. J., 72(3), 245 (1999)
Takeuchi H, Hirama T, Chiba T, Biswas J, Leung LS, Powder Technol., 47, 195 (1986)
Li J, Tung Y, Kwauk M, Pergamon Press, New York, U.S.A., 193 (1988).
Bi HT, Fan LS, AIChE Annual Meeting, Los Angeles, U.S.A., Nov. 17-22 (1991).
Jiang PJ, Bi HT, Liang SC, Fan LS, AIChE J., 40(2), 193 (1994)
Smolders K, Baeyens J, Powder Technol., 119, 206 (2001)
Grace JR, Bi H, Golriz M, Marcel Dekker, New York, U.S.A., 479 (2003).
Yang WC, AIChE J., 21, 1013 (1975)
Geldart D, Academic Press, London, U.K., 383 (1985).
Sciazko M, Raczek J, Bandrowski J, Chem. Eng. Process., 24, 49 (1988)
Choi JH, Chang IY, Shun DW, Yi CK, Son JE, Kim SD, Ind. Eng. Chem. Res., 38(6), 2491 (1999)
Choi JH, Ma SC, Shun DW, Son JE, Kim SD, Korean Chem. Eng. Res., 35, 300 (1997)
Bi HT, Ellis N, Abba IA, Grace JR, Chem. Eng. Sci., 55(21), 4789 (2000)
Werther J, Hartge EU, Marcel Dekker, New York, U.S.A., 111 (2003).
Hazlett JD, Bergougnou MA, Powder Technol., 70, 99 (1992)
Wen CY, Yu YH, AIChE J., 12, 610 (1966)
Ma XX, Kato K, Powder Technol., 95(2), 93 (1998)
Li JL, Kato K, Powder Technol., 118(3), 209 (2001)
Geldart D, Powder Technol., 7, 285 (1973)
Haider A, Levenspiel O, Powder Technol., 58, 63 (1989)
Choi JH, Ryu HJ, Shun DW, Son JE, Kim SD, Ind. Eng. Chem. Res., 37(3), 1130 (1998)

[Referenced By]

[1] Bai DL, Kato K, J. Chem. Eng. Jpn., 28(2), 179 (1995)

[2] Namkung W, Kim SW, Kim SD, Chem. Eng. J., 72(3), 245 (1999)

[3] Takeuchi H, Hirama T, Chiba T, Biswas J, Leung LS, Powder Technol., 47, 195 (1986)

[4] Li J, Tung Y, Kwauk M, Pergamon Press, New York, U.S.A., 193 (1988).

[5] Bi HT, Fan LS, AIChE Annual Meeting, Los Angeles, U.S.A., Nov. 17-22 (1991).

[6] Jiang PJ, Bi HT, Liang SC, Fan LS, AIChE J., 40(2), 193 (1994)

[7] Smolders K, Baeyens J, Powder Technol., 119, 206 (2001)

[8] Grace JR, Bi H, Golriz M, Marcel Dekker, New York, U.S.A., 479 (2003).

[9] Yang WC, AIChE J., 21, 1013 (1975)

[10] Geldart D, Academic Press, London, U.K., 383 (1985).

[11] Sciazko M, Raczek J, Bandrowski J, Chem. Eng. Process., 24, 49 (1988)

[12] Choi JH, Chang IY, Shun DW, Yi CK, Son JE, Kim SD, Ind. Eng. Chem. Res., 38(6), 2491 (1999)

[13] Choi JH, Ma SC, Shun DW, Son JE, Kim SD, Korean Chem. Eng. Res., 35, 300 (1997)

[14] Bi HT, Ellis N, Abba IA, Grace JR, Chem. Eng. Sci., 55(21), 4789 (2000)

[15] Werther J, Hartge EU, Marcel Dekker, New York, U.S.A., 111 (2003).

[16] Hazlett JD, Bergougnou MA, Powder Technol., 70, 99 (1992)

[17] Wen CY, Yu YH, AIChE J., 12, 610 (1966)

[18] Ma XX, Kato K, Powder Technol., 95(2), 93 (1998)

[19] Li JL, Kato K, Powder Technol., 118(3), 209 (2001)

[20] Geldart D, Powder Technol., 7, 285 (1973)

[21] Haider A, Levenspiel O, Powder Technol., 58, 63 (1989)

[22] Choi JH, Ryu HJ, Shun DW, Son JE, Kim SD, Ind. Eng. Chem. Res., 37(3), 1130 (1998)