Ca3Ta(Ga0.9Sc0.1)(3)Si2O14 langasite-type single crystal with a diameter of 1 in. was grown by Czochralski (Cz) method. Obtained crystal had good crystallinity and its lattice constants exceeded those of Ca3TaGa3Si2O14 (CTGS) according to the X-ray analysis. A crack-free specimen cut from the grown crystal was used for the measurements of dielectric constant epsilon(T)(11)/epsilon(0), electromechanical coupling factor k(12) , and piezoelectric constant d(11). The accuracies of these measurements were better than those for the crystal grown by micro-pulling-down (mu-PD) method. Substitution of Ga with Sc resulted modification of these constants in the directions opposite to those observed after partial substitution of Ga (of CTGS) with Al. This suggests that increase of vertical bar d(14)vertical bar was most probably associated with enlargement of average size of the Ga sites. The crystal reported here had greater dimensions as compared to analogous crystals grown by the mu-PD method. As a result, accuracy of determination of acoustic constants of this material may be improved. (C) 2018 Elsevier B.V. All rights reserved.