In this paper, we investigate the effects of film thickness and strain state on the structure, magnetism and electrical transport properties of La0.9Sr0.1CoO3 (LSCO) thin films. The x-ray diffraction analysis shows that the out-of-plane lattice parameters of LSCO films grown on different substrates gradually approach those of the bulk LSCO with increasing film thickness, indicating that the strain induced by the substrates is partially relaxed in thick films, i.e. 100 nm. The film magnetism is gradually enhanced with increasing film thickness. For the 20-nm thick film, it is almost non-magnetic. However, the film becomes ferromagnetic when its thickness increases up to 100 nm. The magnetism is stronger for the film under compressive strain than that under tensile strain. The change in the magnetic properties of films is attributed to the lattice strain, which can affect the spin state of Co ions. Regarding the conductivity, all the samples show a semiconducting-like behavior, and the resistivity is inversely proportional to the film thickness. The electrical transport mechanism of the films with different thickness transforms from a three-dimensional variable range hopping (VRH) to a small-polaron hopping conduction (SPC) with increasing temperature. Fascinatingly, the temperature for transport mechanism transformation decreases gradually with increasing film thickness. This work could shed light on the electrical transport mechanism of LSCO films with different thickness.