Photothermal deflection technique (PTD) is used to investigate the effects of thermal annealing time on non-radiative recombination parameters i.e. nonradiative lifetime of minority carriers, electronic diffusion coefficient, and surface and interface recombination velocity of AlGaAsSb/GaSb laser structure. The extraction of the electronic parameters are performed by PTD technique through extensive modeling by fitting the experimental photothermal signal to the corresponding theoretical ones. We have found that nonradiative recombination parameters have been enhanced by annealing time. These results are very promising for improvement of active layer used for vertical-cavity surface-emitting lasers (VCSELs).