The L X-ray intensity ratios (I-L alpha/I-Ll, I-L alpha/I-L beta, I-L alpha/I-L gamma) and radiative vacancy transfer probabilities eta(L3-Xi) (X = M, N, O i = 1, 4, 5) have been measured for Hg compounds, Pb and its compounds, Bi and its compounds using synchrotron radiation. The L X-ray photons emitted from the elements and compounds are detected with silicon drift detector. The measured intensity ratios and eta(L3-Xi) (X = M, N, O i = 1, 4, 5) have been compared with theoretical and other experimental values. Experimentally, it is observed that intensity ratios are independent of crystal structure but eta(L3-Xi) (X = M, N, O i = 1, 4, 5) are strongly depends on crystal structure.