Morphology is one of key factors to improve performance of organic photovoltaics, and further understanding is required. Conductive atomic force microscopy, C-AFM, is an experimental technique that can reveal morphologies in high resolution, but provides three-dimensional information with difficulty. In this study, dynamic Monte Carlo method is employed to simulate C-AFM of morphologies, which agrees with experiments. Simulation will help to predict three-dimensional morphologies from experimental data.