Solid-State Electronics, Vol.159, 90-98, 2019
GDNMOS and GDBIMOS devices for high voltage ESD protection in thin film advanced FD-SOI technology
GDNMOS (Gated Diode merged NMOS) and GDBIMOS (Gated Diode merged BIMOS) were fabricated using the 28 nm node ultra-thin film UTBB FD-SOI high-k metal gate CMOS technology. The anode current and voltage were measured and simulated for a high number of variants with different connectivity conditions on the terminals. The devices are reconfigurable and promising for high voltage ESD protection applications.