Conducting La0.5Sr0.5CoO3-δ foams for harsh condition microwave shielding

Kesavapillai Sreedeviamma Dijith; Sujith Vijayan; Kuttan Prabhakaran; Kuzhichalil Peethambharan Surendran

Journal of Industrial and Engineering Chemistry, Vol.78, 330-337, October, 2019

DOI10.1016/j.jiec.2019.05.037 Export Citation

Conducting La0.5Sr0.5CoO3-δ foams for harsh condition microwave shielding

Kesavapillai Sreedeviamma Dijith^{1, 2}, Sujith Vijayan³, Kuttan Prabhakaran³, and Kuzhichalil Peethambharan Surendran^{1, 2, †}

¹Materials Science and Technology Division, CSIR-National Institute for Interdisciplinary Science and Technology, Thiruvananthapuram 695019, India
²Academy of Scientific and Innovative Research (AcSIR), Ghaziabad 201002, India
³Department of Chemistry, Indian Institute of Space Science and Technology, Valiamala, Thiruvananthapuram 695547, India

E-mail:

La0.5Sr0.5CoO3-δ (abbreviated as LSCO) foams with broad range of porosities (76.9 to 90.3%) having near spherical cells were prepared through emulsion freeze gelcasting route. The LSCO foam bodies had compressive strength and Young’s modulus in ranges of 1-7 MPa and 57 to 428 MPa, respectively. The increase in resistance of the foams with temperature shows their metallic conducting nature. Out of the three studied samples, the trend in the room temperature conductance follows the order in which their EMI shielding values vary. Compared to the dense LSCO, the electrical conductivity values are inferior in foams, by an order. Impressive electromagnetic interference shielding effectiveness as high as 33 dB has been achieved for LSCO foams prepared at a porosity level of 80% with 10 vol.% LSCO in the composition. The developed LSCO foams are lightweight and capable of withstanding harsh environmental conditions, since they are free from oxidation and survivable at high temperature.

Keywords:La0.5Sr0.5CoO3-δ foams;Emulsion freeze gelcasting;Microwave shielding

[References]

Tong XC, Advanced Materials and Design for Electromagnetic Interference Shielding, CRC Press, United States, 2009.
Jia Z, Lan D, Lin K, Qin M, Kou K, Wu G, Wu H, J. Mater. Sci. Mater. Electron., 29(20), 17122 (2018)
Ding D, Wang Y, Li X, Qiang R, Xu P, Chu W, Han X, Du Y, Carbon, 111, 722 (2017)
Chaudhary A, Kumar R, Dhakate SR, Kumari S, Compos. Part B Eng., 158, 206 (2019)
Chung DDL, Carbon, 39(2), 279 (2001)
Lee CY, Song HG, Jang KS, Oh EJ, Epstein AJ, Joo J, Synth. Met., 102, 1346 (1999)
Hsiao S, Ma CM, Liao W, Wang Y, Li S, Huang Y, Yang R, Liang W, Appl. Mater. Interfaces., 6, 10667 (2014)
Verma P, Saini P, Malik RS, Choudhary V, Carbon, 89, 308 (2015)
Al-Ghamdi AAS, United States Patent. 2010/0321147 A1, 2010.
Kong L, Yin X, Ye F, Li Q, Zhang L, Cheng L, J. Phys. Chem., 117(1), 2135 (2013)
Hutagalung SD, Sahrol NH, Ahmad Z, Ain MF, Othman M, Ceram. Int., 38(1), 671 (2012)
Singh R, Kulkarni SG, Polym. Bull., 71(2), 497 (2014)
Vijayan S, Narasimman R, Prabhakaran K, J. Eur. Ceram. Soc., 34(16), 4347 (2014)
Yin X, Xue Y, Zhang L, Cheng L, Ceram. Int., 38, 2421 (2012)
Li S, Tan Y, Xue J, Liu T, Zhou X, Zhang H, Li S, Tan Y, Xue J, Liu T, Zhou X, AIP Adv. 015027, 0 (2018).
Zhao S, Zhang H, Luo J, Wang Q, Xu B, Hong S, Yu Z, ACS Nano., 12, 11193 (2018)
Wang Y, Fan HJ, J. Phys. Chem. C, 114(32), 13947 (2010)
Suntivich J, Gasteiger HA, Yabuuchi N, Shao-Horn Y, J. Electrochem. Soc., 157(8), B1263 (2010)
Li WW, Hu ZG, Li YW, Zhu M, Zhu ZQ, Chu JH, ACS Appl. Mater. Interfaces, 2(3), 896 (2010)
Endo A, Wada S, Wen CJ, Komiyama H, Yamada K, J. Electrochem. Soc., 145(3), L35 (1998)
Parry JM, Sudbury, Mass, Paul Raccah, Chicago. United States Patent. 4,221,827, 1980.
Liu W, Wang S, Chen Y, Fang G, Li M, Zhao XZ, Sens. Actuators B-Chem., 134(1), 62 (2008)
Dijith KS, Pillai S, Surendran KP, J. Electron. Mater., 46(8), 5158 (2017)
Senarı’s-Rodrı’guez MA, Goodenough JB, J. Solid State Chem., 118, 323 (1995)
Dijith KS, Pillai S, Surendran KP, Surf. Coat. Technol., 330, 34 (2017)
Cheung JT, Morgan PED, Lowndes DH, Zheng XY, Breen J, Appl. Phys. Lett., 62(17), 2045 (1993)
Cheng X, Fabbri E, Nachtegaal M, Castelli IE, El Kazzi M, Haumont R, Marzari N, Schmidt TJ, Chem. Mater., 27(22), 7662 (2015)
Raccah PM, Goodenough JB, J. Appl. Phys., 39(2), 1209 (1968)
Todd MG, Shi FG, J. Appl. Phys., 94(7), 4551 (2003)
Park SH, Theilmann P, Yang K, Rao AM, Bandaru PR, Appl. Phys. Lett., 96(4), 043115 (210)
Madhukar S, Aggarwal S, Dhote AM, Ramesh R, Krishnan A, Keeble D, Poindexter E, J. Appl. Phys., 3543(1997), 3 (2006)
Cuevas FG, Montes JM, Cintas J, Urban P, J. Porous Mater., 16(6), 675 (2009)
Rajeev KP, Shivashankar GV, Raychaudhuri AK, Solid State Commun., 79(7), 591 (1991)
Saini P, Choudhary V, Vijayan N, Kotnala RK, J. Phys. Chem. C, 116, 13403 (2012)
Iqbal S, Shah J, Kotnala RK, Ahmad S, J. Alloy. Compd., 779, 487 (2019)
Li LCX, Yin X, Liang S, Li M, Zhang L, Carbon, 146, 210 (2019)
Al-Saleh MH, Sundararaj U, Carbon, 47(7), 1738 (2009)
Deepa KS, Shaiju P, Sebastian MT, Gowd EB, James J, Phys. Chem. Chem. Phys., 16(32), 17008 (2014)
Zhao B, Fan B, Xu Y, Shao G, Wang X, Zhao W, Zhang R, ACS Appl. Mater. Interfaces, 7(47), 26217 (2015)
Liang C, Wang Z, Wu L, Zhang X, Wang H, Wang Z, ACS Appl. Mater. Interfaces, 9(35), 29950 (2017)
Yan D, Cheng S, Zhuo RF, Chen JT, Feng JJ, Feng HT, Li HJ, Wu ZG, Wang J, Yan PX, Nanotechnol., 20(10), 105706 (2009)
Zhang Q, Gou Y, Wang H, Jian K, Wang Y, Mater. Des., 120, 90 (2017)
Li X, Zhang L, Yin X, Feng L, Li Q, Scr. Mater., 63(6), 657 (2010)

[Referenced By]

[1] Tong XC, Advanced Materials and Design for Electromagnetic Interference Shielding, CRC Press, United States, 2009.

[2] Jia Z, Lan D, Lin K, Qin M, Kou K, Wu G, Wu H, J. Mater. Sci. Mater. Electron., 29(20), 17122 (2018)

[3] Ding D, Wang Y, Li X, Qiang R, Xu P, Chu W, Han X, Du Y, Carbon, 111, 722 (2017)

[4] Chaudhary A, Kumar R, Dhakate SR, Kumari S, Compos. Part B Eng., 158, 206 (2019)

[5] Chung DDL, Carbon, 39(2), 279 (2001)

[6] Lee CY, Song HG, Jang KS, Oh EJ, Epstein AJ, Joo J, Synth. Met., 102, 1346 (1999)

[7] Hsiao S, Ma CM, Liao W, Wang Y, Li S, Huang Y, Yang R, Liang W, Appl. Mater. Interfaces., 6, 10667 (2014)

[8] Verma P, Saini P, Malik RS, Choudhary V, Carbon, 89, 308 (2015)

[9] Al-Ghamdi AAS, United States Patent. 2010/0321147 A1, 2010.

[10] Kong L, Yin X, Ye F, Li Q, Zhang L, Cheng L, J. Phys. Chem., 117(1), 2135 (2013)

[11] Hutagalung SD, Sahrol NH, Ahmad Z, Ain MF, Othman M, Ceram. Int., 38(1), 671 (2012)

[12] Singh R, Kulkarni SG, Polym. Bull., 71(2), 497 (2014)

[13] Vijayan S, Narasimman R, Prabhakaran K, J. Eur. Ceram. Soc., 34(16), 4347 (2014)

[14] Yin X, Xue Y, Zhang L, Cheng L, Ceram. Int., 38, 2421 (2012)

[15] Li S, Tan Y, Xue J, Liu T, Zhou X, Zhang H, Li S, Tan Y, Xue J, Liu T, Zhou X, AIP Adv. 015027, 0 (2018).

[16] Zhao S, Zhang H, Luo J, Wang Q, Xu B, Hong S, Yu Z, ACS Nano., 12, 11193 (2018)

[17] Wang Y, Fan HJ, J. Phys. Chem. C, 114(32), 13947 (2010)

[18] Suntivich J, Gasteiger HA, Yabuuchi N, Shao-Horn Y, J. Electrochem. Soc., 157(8), B1263 (2010)

[19] Li WW, Hu ZG, Li YW, Zhu M, Zhu ZQ, Chu JH, ACS Appl. Mater. Interfaces, 2(3), 896 (2010)

[20] Endo A, Wada S, Wen CJ, Komiyama H, Yamada K, J. Electrochem. Soc., 145(3), L35 (1998)

[21] Parry JM, Sudbury, Mass, Paul Raccah, Chicago. United States Patent. 4,221,827, 1980.

[22] Liu W, Wang S, Chen Y, Fang G, Li M, Zhao XZ, Sens. Actuators B-Chem., 134(1), 62 (2008)

[23] Dijith KS, Pillai S, Surendran KP, J. Electron. Mater., 46(8), 5158 (2017)

[24] Senarı’s-Rodrı’guez MA, Goodenough JB, J. Solid State Chem., 118, 323 (1995)

[25] Dijith KS, Pillai S, Surendran KP, Surf. Coat. Technol., 330, 34 (2017)

[26] Cheung JT, Morgan PED, Lowndes DH, Zheng XY, Breen J, Appl. Phys. Lett., 62(17), 2045 (1993)

[27] Cheng X, Fabbri E, Nachtegaal M, Castelli IE, El Kazzi M, Haumont R, Marzari N, Schmidt TJ, Chem. Mater., 27(22), 7662 (2015)

[28] Raccah PM, Goodenough JB, J. Appl. Phys., 39(2), 1209 (1968)

[29] Todd MG, Shi FG, J. Appl. Phys., 94(7), 4551 (2003)

[30] Park SH, Theilmann P, Yang K, Rao AM, Bandaru PR, Appl. Phys. Lett., 96(4), 043115 (210)

[31] Madhukar S, Aggarwal S, Dhote AM, Ramesh R, Krishnan A, Keeble D, Poindexter E, J. Appl. Phys., 3543(1997), 3 (2006)

[32] Cuevas FG, Montes JM, Cintas J, Urban P, J. Porous Mater., 16(6), 675 (2009)

[33] Rajeev KP, Shivashankar GV, Raychaudhuri AK, Solid State Commun., 79(7), 591 (1991)

[34] Saini P, Choudhary V, Vijayan N, Kotnala RK, J. Phys. Chem. C, 116, 13403 (2012)

[35] Iqbal S, Shah J, Kotnala RK, Ahmad S, J. Alloy. Compd., 779, 487 (2019)

[36] Li LCX, Yin X, Liang S, Li M, Zhang L, Carbon, 146, 210 (2019)

[37] Al-Saleh MH, Sundararaj U, Carbon, 47(7), 1738 (2009)

[38] Deepa KS, Shaiju P, Sebastian MT, Gowd EB, James J, Phys. Chem. Chem. Phys., 16(32), 17008 (2014)

[39] Zhao B, Fan B, Xu Y, Shao G, Wang X, Zhao W, Zhang R, ACS Appl. Mater. Interfaces, 7(47), 26217 (2015)

[40] Liang C, Wang Z, Wu L, Zhang X, Wang H, Wang Z, ACS Appl. Mater. Interfaces, 9(35), 29950 (2017)

[41] Yan D, Cheng S, Zhuo RF, Chen JT, Feng JJ, Feng HT, Li HJ, Wu ZG, Wang J, Yan PX, Nanotechnol., 20(10), 105706 (2009)

[42] Zhang Q, Gou Y, Wang H, Jian K, Wang Y, Mater. Des., 120, 90 (2017)

[43] Li X, Zhang L, Yin X, Feng L, Li Q, Scr. Mater., 63(6), 657 (2010)