화학공학소재연구정보센터
Korean Journal of Materials Research, Vol.30, No.3, 142-148, March, 2020
Ti (10 nm)-buffered 기판들 위에 저온에서 직접 성장된 무 전사, 대 면적, 고 품질 단층 그래핀 특성
Transfer-Free, Large-Scale, High-Quality Monolayer Graphene Grown Directly onto the Ti (10 nm)-buffered Substrates at Low Temperatures
E-mail:
Graphene has attracted the interest of many researchers due to various its advantages such as high mobility, high transparency, and strong mechanical strength. However, large-area graphene is grown at high temperatures of about 1,000 °C and must be transferred to various substrates for various applications. As a result, transferred graphene shows many defects such as wrinkles/ripples and cracks that happen during the transfer process. In this study, we address transfer-free, large-scale, and high-quality monolayer graphene. Monolayer graphene was grown at low temperatures on Ti (10nm)-buffered Si (001) and PET substrates via plasma-assisted thermal chemical vapor deposition (PATCVD). The graphene area is small at low mTorr range of operating pressure, while 4 × 4 cm2 scale graphene is grown at high working pressures from 1.5 to 1.8 Torr. Four-inch wafer scale graphene growth is achieved at growth conditions of 1.8 Torr working pressure and 150 °C growth temperature. The monolayer graphene that is grown directly on the Ti-buffer layer reveals a transparency of 97.4 % at a wavelength of 550 nm, a carrier mobility of about 7,000 cm2/V×s, and a sheet resistance of 98 W/□. Transfer-free, large-scale, high-quality monolayer graphene can be applied to flexible and stretchable electronic devices.
  1. Bolotin KI, Sikes KJ, Jiang Z, Klima M, Fudenberg G. Hone J, Kim P, Stomer HL, Solid State Commun., 146, 351 (2008)
  2. Morozov SV, Novoselov KS, Katsnelson MI, Schedin F, Elias DC, Jaszczak JA, Geim AK, Phys. Rev. Lett., 100, 016602 (2008)
  3. Balandin AA, Ghosh S, Bao W, Calizo I, Teweldebrahan D, Miao F, Lau CN, Nano Lett., 8, 902 (2008)
  4. Lee C, Wei X, Kysar JW, Hone J, Science, 321, 385 (2008)
  5. Zhu YW, Murali S, Cai WW, Li XS, Suk JW, Potts JR, Ruoff RS, Adv. Mater., 22(35), 3906 (2010)
  6. Bae S, Kim SJ, Shin D, Ahn JH, Hong BH, Phys. Scr. T, 146, 014024 (2012)
  7. Geim AK, Novoselov KS, Nat. Mater., 6(3), 183 (2007)
  8. Jin MHC, Durstock M, Dai L, Carbon Nano Technol., 4, 611 (2006)
  9. Bunch JS, Verbridge SS, Alden JS, Zande AMVD, Parpia JM, Craighead HG, McEuen PL, Nano Lett., 8, 4320 (2008)
  10. Li X, Cai W, An JH, Kim SY, Nah JY, et al., Science, 324, 1312 (2009)
  11. Reina A, Jia X, Ho J, Nezich D, Son H, Bulovic V, Dresselhaus MS, Kong J, Nano Lett., 9, 30 (2009)
  12. Li X, Magnuson CW, Venugopal A, Tromp RM, Hannon JB, Vogel EM, Colombo L, Ruoff RS, J. Am. Chem. Soc., 133, 2861 (2011)
  13. An J, Voelkl E, Suk JW, Li X, Magnuson CW, Fu L, Tiemeijer P, Bischoff M, Freitag B, Popova E, Ruoff RS, ACS Nano, 5, 2433 (2011)
  14. Lee JH, Lee EK, Joo WJ, Jang Y, Kim BS, Lim JY, Choi SH, Ahn SJ, Ahn JR, Park MH, Yang CW, Choi BL, Hwang SW, Whang D, Science, 344(6181), 286 (2014)
  15. Park BJ, Choi JS, Eom JH, Ha H, Kim HY, Lee S, Shin H, Yoon SG, ACS Nano, 12, 2008 (2018)
  16. Lee Y, Bae S, Jang H, Jang SJ, Zhu SE, Sim SH, Song YI, Hong BH, Ahn JH, Nano Lett., 10, 490 (2010)