Journal of Physical Chemistry A, Vol.124, No.5, 1047-1052, 2020
Transient Absorption Microscopy of Layered Crystal AsSbS3
We introduce getchellite as a new layered material for fabrication of two-dimensional van der Waals materials and heterostructures. Nanofilms of AsSbS3 were fabricated by mechanical exfoliation. Transient absorption spectroscopy measurements identified a direct bandgap at about 710 nm, which is close to the ideal single-junction photovoltaic bandgap. Transient absorption microscopy measurements with high spatial and temporal resolution were performed to reveal the spatiotemporal dynamics of photocarriers in AsSbS3. We obtained a photocarrier lifetime of about 200 ps, a diffusion coefficient of about 5 cm(2) s(-1), a diffusion length of about 320 nm, and a carrier mobility of about 200 cm(2) V-1 s(-1). These results establish AsSbS3 as a promising two-dimensional semiconductor for optoelectronic applications as an individual material or in heterostructures.