Textural analysis of aluminum hydride

Mijeong Park; Wooram Kim; Younja Kwon; Junhyung Kim; Jonggyu Paik; Youngmin Jo

Journal of Industrial and Engineering Chemistry, Vol.90, 305-311, October, 2020

DOI10.1016/j.jiec.2020.07.028 Export Citation

Textural analysis of aluminum hydride

Mijeong Park, Wooram Kim, Younja Kwon, Junhyung Kim¹, Jonggyu Paik¹, and Youngmin Jo^†

Department of Applied Environmental Science, Kyung Hee University, Yongin-si, Gyeonggi-do 17104, Republic of Korea
¹Agency for Defense Development, Daejeon 34186, Republic of Korea

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The textural properties of aluminum hydride (alane, AlH3) prepared by wet synthesis from lithium aluminum hydride (LiAlH4) and aluminum chloride (AlCl3) were closely investigated with a focus on the effect of reactant ratios on crystal formation. XRD analysis showed that three crystals were almost similar, α-type AlH3, despite the different external morphology. TEM observations also demonstrated their similarity in chemical structures with an average lattice distance between atoms of 1.16 A. Slight differences in thermal decomposition and hydrogen content of each crystalline alane would be due to morphological difference and a little amount of impurities or by-products. When the ratio of reactants (LiAlH4 and AlCl3) was 3:1, a more evident cubic form which is desirable for the use of high energy propellants could be obtained, and the crystal size was 10-20 μm.

Keywords:Aluminum hydride;Crystal structure;Scanning electron microscopy;Transmission electron microscope

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[2] Sandrock G, Reilly J, Graetz J, Zhou WM, Johnson J, Wegrzyn J, Appl. Phys. A-Mater. Sci. Process., 80, 687 (2005)

[3] Graetz J, Chem. Soc. Rev., 38, 73 (2009)

[4] Kim WR, Park MJ, Park YS, Kwon YJ, Jo YM, J. Ind. Eng. Chem., 68, 153 (2018)

[5] Kim WR, Kwon YJ, Adelodun AA, Jo YM, J. Ind. Eng. Chem., 53, 411 (2017)

[6] Graetz J, Reilly JJ, Kulleck JG, Bowman RC, J. Alloy. Compd., 446, 271 (2007)

[7] Sayah ZE, Brahmi R, Beauchet R, Batonneau Y, Kappenstein C, 7th EUCASS, (2017).

[8] Brower FM, Rinn HW, Roberts CB, Schmidt DL, Snover JA, Terada K, J. Am. Chem. Soc., 98, 2450 (1976)

[9] Yartys VA, Denys RV, Maehlen JP, Frommen C, Fichtner M, Bulychev BM, Emerich H, Inorg. Chem., 46, 1051 (2006)

[10] Muto S, Tatsumi K, Ikeda K, Orimo S, J. Appl. Phys., 105, 123514 (2009)

[11] Ikeda K, Muto S, Tatsumi K, Menjo M, Kato S, Bielmann M, Zuttel A, Jensen CM, Orimo S, Nanotechnology, 20, 204004 (2009)

[12] Kato S, Bielmann M, Ikeda K, Orimo S, Borgschulte A, Zuttel A, Appl. Phys. Lett., 96, 051912 (2010)

[13] Bulychev BM, Verbetskii VN, Sizov AI, Zvukova TM, Genchel’ VK, Fokin VN, Russ. Chem. Bull., 56, 1305 (2007)

[14] Brinks HW, Istad-Lem A, Hauback BC, J. Phys. Chem. B, 110(51), 25833 (2006)

[15] Xu B, Liu J, Wang X, Vacuum, 99, 127 (2014)

[16] Sood S, Gouma P, J. Am. Ceram. Soc., 96(9), 3008 (2013)

[17] Park M, Kim W, Kwon Y, Kim J, Jo YM, Propellants Explos. Pyrotech., 44, 1494 (2019)

[18] Maehlen JP, Yartys VA, Denys RV, Fichtner M, Frommen C, Bulychev BM, Pattison P, Emerich H, Filinchuk YE, Chernyshov D, J. Alloy. Compd., 446, 280 (2007)

[19] Lund GK, Hanks JM, Johnston HE, US Patent No. 7238336B2 (2007).

[20] Turley JW, Rinn HW, Inorg. Chem., 8, 19 (1969)

[21] Cullity BD, Stock SR, Elements of X-ray Diffraction, Pearson India Education Services, 2014.

[22] Graetz J, Reilly JJ, J. Alloy. Compd., 424, 262 (2006)

[23] Sandrock G, Reilly J, Graetz J, Zhou WM, Johnson J, Wegrzyn J, Appl. Phys. A-Mater. Sci. Process., 80, 687 (2005)