Journal of Industrial and Engineering Chemistry, Vol.92, 145-157, December, 2020
Defects and dopant alliance towards bound magnetic polarons formation and mixed magnetic characteristics in Fe doped ZnO nanoparticles
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Fe doped ZnO powders, Zn1-xFexO (x = 0.0.03) confirmed to be single phased using X-ray diffraction (XRD) measurement (step size of 0.01°) revealed a change in oxidation state of Fe with increased fraction of Zinc interstitials, Zni and Oxygen vacancy, Vo defects through Photoelectron spectroscopy and Photoluminescence (PL) studies. The Raman and PL spectra have registered the inclusion of Vo-Zni complex defects also. An ideal position of E2(Low) Raman mode justifies the effectual cationic substitution of Fe species. Inclusion of paramagnetic (PM) component is successfully substantiated through Bound Magnetic Polaron (BMP) model fitting. For x = 0.01, a residual PM component is ensured through temperature dependent magnetization, M(T) characteristics as well. A close fit of the Field cooled (FC) branch by the 3-D spin wave model (T = 99-300 K) points towards the intrinsic nature of ferromagnetism mediated by the effectual substitution of Fe2+ ions and the inclusion of BMPs. At lower temperature (T < 99 K), a good fit to the Curie-Weiss model (C-W) quantifies an estimated cluster size of the order of 10-3, subtle enough to restrict the introduction of spin glass state, thereby justifying the suitability of these nanoparticles for spintronics applications. Excellent PM properties are achieved for x = 0.03 at T = 300 K.
- Kunj S, Sreenivas K, J. Ind. Eng. Chem., 60, 151 (2018)
- Ozgur U, Hofstetter D, Morkoc H, Proc. IEEE, 98, 1255 (2010)
- Samariya A, Singhal RK, Kumar S, Xing YT, Alzamora M, Dolia SN, Deshpande UP, Shripathi T, Saitovitch EB, Mater. Chem. Phys., 123(2-3), 678 (2010)
- Lin Y, Jiang DM, Lin F, Shi WZ, Ma XM, J. Alloy. Compd., 436, 30 (2007)
- Limaye MV, Singh SB, Das R, Poddar P, Kulkarni SK, J. Solid State Chem., 184, 391 (2011)
- Durst AC, Bhatt RN, Wolff PA, Phys. Rev. B, 65, 235205 (2002)
- Sato K, Yoshida HK, MRS Proc., 666, F4.6 (2001)
- Pan F, Song C, Liu XJ, Yang YC, Zeng F, Mater. Sci. Eng. R-Rep., 62, 1 (2008)
- Pearton SJ, Norton DP, Ip K, Heo YW, Steiner T, J. Vac. Sci. Technol. B, 22(3), 932 (2004)
- Ariyakkani P, Suganya L, Sundaresan B, J. Alloy. Compd., 695, 3467 (2017)
- Kittel C, Introduction to Solid State Physics, John Wiley & Sons, Inc, USA, 2008.
- Sharma D, Jha R, Ceram. Int., 43, 8488 (2017)
- Joshi A, Singh G, Sharma RK, Chem. Eng. J., 384, 123364 (2020)
- Vanalakara SA, Patil VL, Harale NS, Vhanalakar SA, Gang MG, Kim JY, Patil PS, Kim JH, Sens. Actuators B-Chem., 221, 1195 (2015)
- Meng F, Ge F, Chen Y, Xu G, Huang F, Surf. Coat. Technol., 365, 2 (2019)
- Bian H, Ma S, Sun A, Xu X, Yang G, Yan S, Gao J, Zhang Z, Zhu H, J. Alloy. Compd., 658, 629 (2016)
- Wu ZW, Tyan SL, Chen HH, Huang JCA, Huang YC, Lee CR, Mo TS, Superlattices Microstruct., 107, 38 (2017)
- Yao Z, Tang K, Xu Z, Ma J, Ye J, Zhu S, Gu S, J. Alloy. Compd., 735, 1232 (2018)
- Chauhan L, Shukla AK, Sreenivas K, Ceram. Int., 42, 12136 (2016)
- Pal B, Giri PK, J. Appl. Phys., 108, 084322 (2010)
- Wagner CD, Riggs WM, Davis LE, Moulder JF, Muilenberg GE, Handbook of X-Ray Photoelectron Spectroscopy, Perkin-Elmer, Eden Prairie, MN, 1978.
- Palomino P, Perez OP, Singhal R, Tomar M, Hwang J, Voyles PM, J. Appl. Phys., 103, 07D121 (2008)
- Bhakta N, Inamori T, Shirakami R, Tanioku Y, Yoshimura K, Chakrabarti PK, Mater. Res. Bull., 104, 6 (2018)
- Ahmed F, Arshi N, Anwar MS, Lee SH, Byon ES, Lyu NJ, Koo BH, Curr. Appl. Phys., 12, S174 (2012)
- Kunj S, Sreenivas K, Curr. Appl. Phys., 16(7), 748 (2016)
- Mondal A, Pal S, Sarkar A, Bhattacharya TS, Das A, Gogurla N, Ray SK, Kumar P, Kanjilal D, Devi KD, Singha A, Chattopadhyay S, Jana D, Mater. Sci. Semicond. Process, 80, 111 (2018)
- Jothilakshmi R, Ramakrishnan V, Thangavel R, Kumar J, Sarua A, Kuball M, J. Raman Spectrosc., 40, 556 (2009)
- Zhao X, Liu EJ, Ramanujan RV, Chen JS, Curr. Appl. Phys., 12(3), 834 (2012)
- Zhaoyang W, Lizhong H, Vacuum, 83, 906 (2009)
- Wang C, Chen Z, Hu H, Zhang D, Physica B, 404, 4075 (2009)
- Verma KC, Kotnala RK, J. Solid State Chem., 237, 211 (2016)
- Kumari C, Pandey A, Dixit A, J. Alloy. Compd., 735, 2318 (2018)
- Tu N, Bui HV, Trung DQ, Duong AT, Thuy DM, Nguyen DH, Nguyen KT, Huy PT, J. Alloy. Compd., 791, 722 (2019)
- Vempati S, Shetty A, Dawson P, Nanda KK, Krupanidhi SB, Thin Solid Films, 524, 137 (2012)
- Vinodkumar R, Navas I, Porsezian K, Ganesan V, Unnikrishnan NV, Pillai VPM, Spectroc. Acta Pt. A-Molec. Biomolec. Spectr., 118, 724 (2014)
- Goswami N, Sahai A, Mater. Res. Bull., 48(2), 346 (2013)
- Dhiman P, Batoo KM, Kotnala RK, Chand J, Singh M, Appl. Surf. Sci., 287, 287 (2013)
- Kharroubi B, Baghdad R, Abdiche A, Bousmaha M, Bousquet M, Zeinert A, El Marssi M, Zellama K, Hamzaoui S, Physica Scripta, 86, 015805 (2012)
- Lai YF, Huanga JH, Chen YC, Liu CP, Yang YW, J. European Ceram. Soc., 33, 1809 (2013)
- Bousslama W, Elhouichet H, Ferid M, Optik, 134, 88 (2017)
- James KK, Aravind A, Jayaraj MK, Appl. Surf. Sci., 282, 121 (2013)
- Tayebee R, Javadi F, Argi G, J. Mol. Catal. A-Chem., 368, 16 (2013)
- Pal B, Dhara S, Giri PK, Sarkar D, J. Alloy. Compd., 615, 378 (2014)
- Saikia L, Bhuyan D, Saikia M, Malakar B, Dutta DK, Sengupta P, Appl. Catal. A: Gen., 490, 42 (2015)
- Hu Y, Chen YQ, Wu YC, Wang MJ, Fang GJ, He CQ, Wang SJ, Appl. Surf. Sci., 255(22), 9279 (2009)
- Chia MY, Chiu WS, Daud SNH, Khiew PS, Radiman S, Shukor RA, Hamid MAA, Mater. Charact., 106, 185 (2015)
- Mereu RA, Mesaros A, Vasilescu M, Popa M, Gabor MS, Ciontea L, Petrisor T, Ceram. Int., 39, 5535 (2013)
- Chakraborty S, Kumbhakar P, Opt. Commun., 318, 61 (2014)
- Kumar V, Swart HC, Gohain M, Kumar V, Som S, Bezuindenhoudt BCB, Ntwaeaborwa OM, Ultrason. Sonochem., 21, 1549 (2014)
- Raghavendra PV, Bhat JS, Deshpande NG, Mater. Sci. Semicond. Process, 68, 262 (2017)
- Kumar N, Srivastava A, J. Alloy. Compd., 706, 438 (2017)
- Zhang DH, Xu ZY, Wang QP, J. Phys. D-Appl. Phys., 35(21), 2837 (2002)
- Ding JJ, Chen HX, Ma SY, Appl. Surf. Sci., 256(13), 4304 (2010)
- Chen HX, Ding JJ, Guo WG, Shi F, Li YF, Appl. Surf. Sci., 258(24), 9913 (2012)
- Spadoni A, Addonizio ML, Thin Solid Films, 589, 514 (2015)
- Kanchana S, Chithra MJ, Ernest S, Pushpanathan K, J. Lumines., 176, 6 (2016)
- Mishra SK, Bayan S, Shankar R, Chakraborty P, Srivastava RK, Sens. Actuators A-Phys., 211, 8 (2014)
- Vanheusden K, Warren WL, Seager CH, Tallant DR, Voigt JA, Gnade BE, J. Appl. Phys., 79(10), 7983 (1996)
- Sun YM, Ph.D. Thesis, University of Science and Technology of China, July 2000.
- Park WI, Kim DH, Jung SW, Yi GC, Appl. Phys. Lett., 80, 4232 (2002)
- Reynolds DC, Look DC, Jogai B, Morkoc H, Solid State Commun., 101, 643 (1997)
- Tawale JS, Kumar A, Swati G, Haranath D, Dhoble SJ, Srivastava AK, Mater. Chem. Phys., 205, 9 (2018)
- Marin D, Tirado M, Budini N, Mosquera E, Figueora C, Comedi D, Mater. Sci. Semicond. Process, 56, 59 (2016)
- Bekkari R, laanab L, Boyer D, Mahiou R, Jaber B, Mater. Sci. Semicond. Process, 71, 181 (2017)
- Pal B, Dhara S, Giri PK, Sarkar D, J. Alloy. Compd., 647, 558 (2015)
- Parmar NS, Choi JW, Boatner LA, McCluskey MD, Lynn KG, J. Alloy. Compd., 729, 1031 (2017)
- Huang G, Yang Y, Sun H, Xu S, Wang J, Ahmad M, Xu Z, J. Alloy. Compd., 724, 1149 (2017)
- Song X, Schrade M, Maso N, Finstad TG, J. Alloy. Compd., 710, 762 (2017)
- Rainey K, Chess J, Eixenberger J, Tenne DA, Hanna CB, Punnoose A, J. Appl. Phys., 115, 17D727 (2014)
- Singh K, Rawal I, Gautam P, Sharma N, Dhar R, J. Magn. Magn. Mater., 468, 259 (2018)
- Gao D, Xu Y, Zhang Z, Gao H, Xue D, J. Appl. Phys., 105, 063903 (2009)
- Fan JP, Jiang FX, Quan ZY, Qing XF, Xu XH, Mater. Res. Bull., 47(11), 3344 (2012)
- Liu SH, Hsu HS, Lin CR, Lue CS, Huang JCA, Appl. Phys. Lett., 90, 222505 (2007)
- Cullity BD, Graham CD, Introduction to Magnetic Materials, 2nd ed., Wiley, New Jersey, 2009.
- Huang JCA, Hsu HS, Hu YM, Lee CH, Huang YH, Lin MZ, Appl. Phys. Lett., 85, 3815 (2004)
- Srinet G, Kumar R, Sajal V, J. Appl. Phys., 114, 033912 (2013)
- Navarro AMM, Torres CER, Bilovol V, Cabrera AF, Errico LA, Weissman M, J. Appl. Phys., 115, 223908 (2014)