화학공학소재연구정보센터
Journal of Vacuum Science & Technology A, Vol.12, No.4, 2515-2522, 1994
Static Secondary-Ion Mass-Spectrometry and X-Ray Photoelectron-Spectroscopy for the Characterization of Surface-Defects in Paper Products
In many cases the surface chemistry of paper plays an important role in the performance of the paper in its end use. Differences in surface chemistry of paper can result from both intentional and unintentional changes in chemical additives and manufacturing processes. Examples of the impact of surface chemistry on end use performance include : ink or toner wetting and adhesion in printing, polymer adhesion in lamination and extrusion, slip due to changes in coefficient of friction, and visual defects. While paper represents a less than ideal specimen for classical surface analysis, x-ray photoelectron spectroscopy (XPS) and static secondary ion mass spectrometry (SIMS) are two techniques that can be used successfully to characterize defects in paper that are due to changes in surface chemistry. In this presentation, some of the problems associated with the surface analysis of paper by XPS and SIMS will be discussed along with several examples detailing successful characterization of surface defects in paper utilizing these techniques.