화학공학소재연구정보센터
Journal of Vacuum Science & Technology A, Vol.15, No.4, 2143-2147, 1997
Analysis of the X-Ray Photoelectron-Spectrum of Teflon Af-1600
The C Is, F Is, and O Is components of the x-ray photoelectron spectroscopy spectrum of Teflon AF 1600 have been obtained and their constituent peaks were separated and attributed. The effect of an intervening carbon atom on the F Is spectrum has been shown to decrease the inductive effect of a next-nearest neighbor fragment. An unexpected chemical shift in the O Is spectrum has been traced to nonbonded steric interactions of close lying rings.