Ni et al. (Research Articles, 20 March 2020, p. 1352) report bulk trap densities of 1011 cm(-3) and an increase in interfacial trap densities by one to four orders of magnitude from drive-level capacitance profiling of lead halide perovskites. From electrostatic arguments, we show that the results are not trap densities but are a consequence of the geometrical capacitance and charge injection into the perovskite layer.