Journal of Vacuum Science & Technology A, Vol.17, No.1, 9-13, 1999
Molecular beam epitaxial growth and structural properties of Bi1-xSbx alloy thin films on CdTe(III) substrates
We have successfully grown BiSb alloy thin films on CdTe(111)B over a wide range of Sb compositions using molecular beam epitaxy. Structural properties have been investigated using in situ reflection high-energy electron diffraction, x-ray diffraction, and atomic force microscopy. Adding Sb to Bi leads to a reduction of the lattice constant, poorer crystallinity, and a rougher surface morphology.