Previous Article Next Article Table of Contents Journal of Vacuum Science & Technology B, Vol.12, No.6, 3503-3507, 1994 DOI10.1116/1.587459 Export Citation Sub-40 nm Resolution 1 keV Scanning Tunneling Microscope Field-Emission Microcolumn Kratschmer E, Kim HS, Thomson MG, Lee KY, Rishton SA, Yu ML, Chang TH Keywords:ELECTRON [Referenced By] Please enable JavaScript to view the comments powered by Disqus.
