Previous Article Next Article Table of Contents Journal of Vacuum Science & Technology B, Vol.12, No.6, 3614-3618, 1994 DOI10.1116/1.587482 Export Citation Silicon Point Contacts - Nanofabrication, Molecular-Beam Epitaxial-Growth, and Transport Measurements Maes JW, Caro J, Werner K, Radelaar S, Kozub VI, Zandbergen HW Keywords:CONDUCTANCE FLUCTUATIONS Please enable JavaScript to view the comments powered by Disqus.
