Previous Article Next Article Table of Contents Journal of Vacuum Science & Technology B, Vol.12, No.6, 3681-3684, 1994 DOI10.1116/1.587639 Export Citation Fabrication of Arrays of Nanometer-Size Test Structures for Scanning Probe Microscope Tips Characterization Bogdanov AL, Erts D, Nilsson B, Olin H Keywords:ATOMIC-FORCE MICROSCOPY;TUNNELING MICROSCOPY;ROUGH SURFACES;IMAGES;RECONSTRUCTION;SHAPE Please enable JavaScript to view the comments powered by Disqus.
