Previous Article Next Article Table of Contents Journal of Vacuum Science & Technology B, Vol.13, No.2, 350-354, 1995 DOI10.1116/1.587944 Export Citation Scanning Force Microscope Technique for Adhesion Distribution Measurement Sasaki M, Hane K, Okuma S, Torii A Keywords:TUNNELING MICROSCOPY;HUMIDITY;PROBE;AIR Please enable JavaScript to view the comments powered by Disqus.
