Previous Article Next Article Table of Contents Journal of Vacuum Science & Technology B, Vol.13, No.2, 777-781, 1995 DOI10.1116/1.588162 Export Citation Nondestructive Characterization of Pseudomorphic High-Electron-Mobility Transistor Structures Using X-Ray-Diffraction and Reflectivity Rogers TJ, Ballingall JM, Larsen M, Hall EL Please enable JavaScript to view the comments powered by Disqus.
