Previous Article Next Article Table of Contents Journal of Vacuum Science & Technology B, Vol.13, No.3, 1155-1162, 1995 DOI10.1116/1.588228 Export Citation Atomistic Modeling of Imaging of Ionic Surfaces with a Scanning Force Microscope Shluger AL, Rohl AL, Wilson RM, Williams RT Keywords:RESOLUTION;ADHESION;VACUUM;TIP Please enable JavaScript to view the comments powered by Disqus.
