Journal of Vacuum Science & Technology B, Vol.13, No.3, 1172-1177, 1995
Characterization of Exfoliated TaS2 Thin-Films and the Existence of Charge-Density Waves
Keywords:SCANNING-TUNNELING-MICROSCOPY;TRANSITION-METAL DICHALCOGENIDES;ATOMIC FORCE MICROSCOPY;CHEMICAL VAPOR-DEPOSITION;TUNNELLING MICROSCOPY;ELECTRONIC-PROPERTIES;VANDERWAALS EPITAXY;DIFFERENT RESPONSE;MOS2;DISULFIDE