Previous Article Next Article Table of Contents Journal of Vacuum Science & Technology B, Vol.13, No.3, 1225-1229, 1995 DOI10.1116/1.588241 Export Citation Properties of Ultrathin Films of Porous Silicon Vonbehren J, Ucer KB, Tsybeskov L, Vandyshev JV, Fauchet PM Keywords:SPECTROSCOPY;SURFACE Please enable JavaScript to view the comments powered by Disqus.
