Previous Article Next Article Table of Contents Journal of Vacuum Science & Technology B, Vol.13, No.3, 1261-1264, 1995 DOI10.1116/1.587834 Export Citation Structural-Analysis of Domain Boundaries on Si(111)7X7 Surfaces by Scanning Tunneling Microscope Gu QJ, Zhao WB, Ma ZL, Liu N, Xue ZQ, Pang SJ Keywords:GROWTH Please enable JavaScript to view the comments powered by Disqus.
