화학공학소재연구정보센터
Journal of Vacuum Science & Technology B, Vol.13, No.6, 2483-2487, 1995
Error Budget Analysis of the Scalpel(R) Mask for Sub-0.2 Mu-M Lithography
In this article we derive the design constraints, and hence the fabrication requirements, for the SCALPEL (R) mask for sub-0.2 mu m design rules. These are determined by the Semiconductor Industry Association (SIA) advanced mask specifications, in combination with the likely error budget of an advanced pattern generator. Further constraints are imposed by the overall SCALPEL system error budget. We demonstrate that the mask is not only technically feasible to construct, but also that it can be fabricated at an acceptable cost.