A new method for obtaining force-distance curves using scanning force microscopy is suggested. The theoretical justification for this method is discussed. The method, involving frequency domain measurements of cantilever motion, is predicted to provide improved force data using standard single point measurement of the cantilever deflection. Shortcomings of the standard Hookian model that are alleviated by our model are discussed. Spectroscopic information and knowledge of the applied force during intermittent contact mode imaging are shown to be more appropriately determined using the new method.