A simple numerical procedure for separating the probe tip from images obtained by atom;e force microscopy (AFM) is presented. The importance of this is 2-fold : first, it provides a way of visualizing the probe tip in a nondestructive manner, which is useful in eliminating artifacts; second, it enables the deconvolution of the probe tip from the image, resulting in a more accurate picture of the sample. Examples of deconvolution using both an idealized tip and a real tip are given. Such a quick and effective procedure enables incorporating the visualization of AFM tips as a daily routine.