Polyaniline (PAM) protonated with camphorsulfonic acid (CSA) is one of the most promising conductive polymers due to its relatively high crystallinity, high electrical conductivity, and the metallic characteristics at high temperatures, i.e., a positive temperature coefficient of resistivity. The crystalline structure of this polymer system is still not known in detail; however, significant developments in this field have been achieved recently. In this work we present the results obtained for the series of 50 thin film samples of the PANI/CSA system,prepared under various conditions. These films were subjected to the X-ray diffraction study as well as electrical conductivity measurements. The results of this work clearly show that the conductivity of the samples strongly depends both on their degree of crystallinity and on the degree of order of the dopant anions. This ordering can be described quantitively by the relative intensity of properly selected diffraction reflections. Besides, some important conclusions concerning the anisotropy of the films subjected to the investigations may be drawn by comparison of the diffraction patterns obtained in a transmission and reflection geometry of diffraction.