Temperature dependence of the electrical resistivity of La1-xCxMnO3 (x = 0.2, 0.3) samples sintered at two different temperatures are compared to understand the origin of the double-maxima-type resistivity curves of some doped perovskite manganates reported in the literature. It is shown that compositional inhomogeneity is responsible for the anomalous electrical properties of the substituted manganate samples processed at low temperatures.