Thin V2O5 films have been prepared by thermal evaporation onto glass substrates at a pressure of about 1.99x10(-3) Pa. The temperature dependence of electrical measurements exhibits an anomaly in resistivity at a temperature around 329 K. Temperature co-efficient of resistance (TCR) studies show positive values, so indicating semi-metallic behaviour up to a temperature of 363 K and the negative thereafter so indicating semi-conducting behaviour. Thickness-dependent resistivity measurement follows the Fuchs-Sordheimer size-effect theory. X-ray diffraction studies show that the material is amorphous. Optical studies show the material is highly transparent both in the visible and infrared regions. The integrated value of T-lum and T-sol is high, so indicating that the material is a potential candidate for selective surface applications.