화학공학소재연구정보센터
Polymer Bulletin, Vol.33, No.3, 331-338, 1994
An X-Ray Photoelectron-Spectroscopy Study of Poly(Methyl Methacrylate) Surface-Modified by 193/nm Laser-Radiation
The chemistry of poly(methyl methacrylate) subjected to 193-nm radiation, emitted by an argon-fluorine excimer laser, was studied by X-ray photoelectron spectroscopy. From the O/C atomic ratios measured at two different sampling depths, it is concluded that the role of depolymerization in the laser ablation process may be less important than previously suggested.