A novel method of mounting particles on regularly spaced adhesive circles has been developed. This method of mounting results in ordered array rather than the random chaos of usual methods and greatly facilitates particle examination, identification and analysis. The application of these ’tacky dots’ to sieve calibration is described. Particle size analyses carried out using different sets of sieves tend to differ widely and available methods of calibration tend to be so time consuming that they are rarely used. The procedure described here is simple, gives high reproducibility and calibrates the sieves against volume diameter. An application of the procedure to crystal size determination is also covered.