Structures consisting of alternating Te and Zn layers were prepared by RF-sputtering. Grazing incidence X-ray diffraction (GIXD) measurements revealed the formation of ZnTe and the existence of free Zn in as-deposited samples. Similar measurements on samples annealed for 2 h at 300 degrees C showed enhanced crystallinity of ZnTe as well as the formation of oxides when annealing time is extended to 8 h. UV-Visible-NIR transmission measurements showed that metallic-type absorption dominates in as-deposited samples. Annealed samples at 300 degrees C showed well defined absorption edges with an energy gap of 2.50 eV for annealing times of 2 h and 2.24 eV when the annealing time is extended to 8 h.