Solar selective tungsten-alumina cermets were deposited with a low-pressure cold-wall CVD-system utilising the simultaneous pyrolytical decomposition of tungstenhexacarbonyl and aluminiumtriisopropylate (ATI). The deposition results in amorphous W-WOx-Al2O3 films. After a post-deposition annealing in pure hydrogen at 800 degrees C for a maximum of 1 h the films consist of fine grained gamma-alumina and metallic tungsten. The hemispheric reflectivity was measured from 0.2-25 mu m and compared to the emissivity, measured with a thermopile set-up. An absorptivity of 0.85 and an emissivity of 0.04 could be obtained for a single layer on copper substrates, Improvement of the absorption by a gradient of the tungsten content in the layer was investigated.