화학공학소재연구정보센터
Thin Solid Films, Vol.239, No.2, 172-174, 1994
Perpendicular Electrical-Conduction in Cu/Cr Multilayer Films at Low-Temperatures
The electrical resistivity and the temperature coefficient of resistance (TCR) of Cu/Cr multilayer films have been studied in the temperature range 30-300 K. Two sets of film are investigated, one with a constant number of double layers and increasing bilayer wavelength A in the range 4-12 nm, and the other with constant A and a varying number of double layers n in the range 5-30. The bilayer wavelength dependence of room temperature resistivity rho(RT) and TCR exhibits oscillatory behaviour. The TCR is found to be proportional to the inverse of the bilayer wavelength. The experimental results are analyzed in the light of the Mayadas and Shatzkes model.