We demonstrate scanning photothermal beam deflection measurements for imaging refractive index structures. Two different systems have been investigated. First, a polymer dye blend (PMMA/DR1) has been structured by laser photobleaching which results in a refractive index and therefore in an absorption coefficient pattern. This method consists of utilizing the change in absorption spectra by bleaching and, hence, reversing the contrast in the image by properly changing the pumping wavelength. Second, integrated optical waveguide devices fabricated from PMMA/DR1 and polythiophene via photobleaching in a mask aligner have been imaged by this technique.