Previous Article Next Article Table of Contents Thin Solid Films, Vol.293, No.1-2, 334-334, 1997 DOI10.1016/S0040-6090(96)09574-0 Export Citation Characterization of Porous Silicon-on-Insulator Films Prepared by Anodic-Oxidation (Vol 276, Pg 147, 1996) Lee CH, Yeh CC, Hwang HL, Hsu KY Please enable JavaScript to view the comments powered by Disqus.
