Thin Solid Films, Vol.297, No.1-2, 188-191, 1997
Luminescence and Raman Characterization of Molecular and Nanocrystalline Silicon Clusters
Silicon clusters prepared by low energy cluster beam deposition exhibit visible luminescence similar to that observed in porous silicon. The structure and properties are characterized by different complementary techniques with a special emphasis on Raman spectroscopy. The comparison with silicon clathrates structures is promising. The validity of the confinement model in a size range down to a few angstroms is discussed.