화학공학소재연구정보센터
Thin Solid Films, Vol.313-314, 781-784, 1998
A study of quantitative electrochemical analysis through a spectroellipsometric technique with a new function
Ellipsometry with a new function the 'Optical tracking rate' (Vop), used to analyze electrochemical reactions as suggested by the authors, is described briefly. A series of applications of this new approach for qualitative and quantitative analysis including so-called potential scanning ellipsometry and stripping ellipsometry is introduced and discussed in this article. The experimental results indicate that stripping ellipsometry for quantitative analysis has a higher sensitivity and accuracy than the electrochemical method.